A Prony-based curve-fitting method for characterization of RF pulses from optoelectronic devices

Published in IEEE Signal Processing Letters, 2021

Recommended citation: Mukherjee, S., Dowling, K.M., Dong. Y, Li, K. Conway, A., Rakheja, S., and Voss, L., “A Prony-based curve-fitting method for characterization of RF pulses from optoelectronic devices,” IEEE Signal Processing Letters, vol. 29, pp. 364-368, 2021. https://doi.org/10.1109/LSP.2021.3135795