Low Offset and Noise in High Biased GaN 2DEG Hall-Effect Plates Investigated with Infrared Microscopy

Published in IEEE Journal of Microelectromechanical Systems, 2020

Recommended citation: Dowling, K.M., Liu, T., Alpert, H.S., Chapin, C.A., Eisner, S.R., Yalamarthy, A., Satterthwaite, P.F., Köck, H., Ausserlechner, U., Asheghi, M., Goodson, K.E., and Senesky, D.G., “Low Offset and Noise in High Biased GaN 2DEG Hall-Effect Plates Investigated with Infrared Microscopy,” Journal of Microelectromechanical Systems, vol. 29, 5, pp.1-8, 2020. https://doi.org/10.1109/JMEMS.2020.3013187